In-plane strain states of standard and flip-chip GaN epilayers

Author: Zuo Z. Y.   Liu D.   Wang R. J.   Qin S. B.   Liu H.   Xu X. G.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|54|1|10101-10101

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.54, Iss.1, 2011-04, pp. : 10101-10101

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Abstract