Author: Gong H. Hao X. Xia W. Wu Y. Xu X.
Publisher: Edp Sciences
E-ISSN: 1286-0050|50|1|10301-10301
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.50, Iss.1, 2010-04, pp. : 10301-10301
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Light induced contrast in Kelvin Force Microscopy of GaN epilayers
By Bozek R. Pakula K. Baranowski J.
EPJ Applied Physics (The), Vol. 27, Iss. 1-3, 2010-03 ,pp. :
Temperature-dependent Schottky barrier inhomogeneity of Ni/n-GaAs diodes
By Yildirim N. Korkut H. Türüt A.
EPJ Applied Physics (The), Vol. 45, Iss. 1, 2009-01 ,pp. :