Adhesion and leakage current characteristics of selective CVD tungsten films on the silicon substrate

E-ISSN： 1764-7177|03|C3|C3-433-C3-440

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.03, Iss.C3, 1993-08, pp. : C3-433-C3-440

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