Characterization of roughness correlations in W/Si multilayers by diffuse x-ray scattering

E-ISSN： 1764-7177|04|C9|C9-171-C9-174

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.04, Iss.C9, 1994-11, pp. : C9-171-C9-174

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