Publisher: Edp Sciences
E-ISSN: 1764-7177|09|PR8|Pr8-935-Pr8-942
ISSN: 1155-4339
Source: Le Journal de Physique IV, Vol.09, Iss.PR8, 1999-09, pp. : Pr8-935-Pr8-942
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
THIN FILM OF CERAMIC OXIDES BY MODIFIED CVD
Le Journal de Physique Colloques, Vol. 50, Iss. C5, 1989-05 ,pp. :
Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics∗
By CHANDRA P.
Ferroelectrics, Vol. 313, Iss. 1, 2004-01 ,pp. :
Stress Induced Depolarisation of Ferroelectrics in Thin Film Form
By Algueró M. Hvizdos P. Bushby A. J. Reece M. J.
Ferroelectrics, Vol. 267, Iss. 1, 2002-01 ,pp. :
Nanoscale cobalt oxides thin films obtained by CVD and sol-gel routes
Le Journal de Physique IV, Vol. 11, Iss. PR3, 2001-08 ,pp. :
Dynamic Dielectric Nonlinearity in Epitaxial Thin-Film Relaxors and Ferroelectrics
Ferroelectrics, Vol. 339, Iss. 1, 2006-01 ,pp. :