Simulation and validation of SiO$_2$ LPCVD from TEOS in a vertical 300 mm multi-wafer reactor

Publisher: Edp Sciences

E-ISSN: 1764-7177|12|4|51-61

ISSN: 1155-4339

Source: Le Journal de Physique IV, Vol.12, Iss.4, 2002-06, pp. : 51-61

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