Related content

Ferroelectric Properties and Memory Characteristics of Epitaxial Pb(Zr0.3Ti0.7)O3 Thin Films with Different Thicknesses Crystallized by Hot Isostatic Pressing

By Fukushima Koji  

Ferroelectrics, Vol. 357, Iss. 1, 2007-01 ,pp. : 264-270

Taylor & Francis Ltd

Access to resources Recommend Favorite

Thermal stability of fcc structure in FeNi films of various thicknesses

By Gorovoi A.  

Technical Physics Letters, Vol. 31, Iss. 1, 2005-01 ,pp. : 43-45

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Interface traps density of anodic porous alumina films of different thicknesses on Si

By  

Journal of Physics: Conference Series , Vol. 10, Iss. 1, 2005-01 ,pp. : 222-225

IOP Publishing

Access to resources Recommend Favorite

Speckle interferometric technique to assess soap films

By Tebaldi M.   Angel L.   Bolognini N.   Trivi M.  

Optics Communications, Vol. 229, Iss. 1, 2004-01 ,pp. : 29-37

Elsevier

Access to resources Recommend Favorite

Laser Interferometric Measurement and Computerized Evaluation of Ultrasonic Displacements

By Reibold R.   Molkenstruck W.  

Acta Acustica united with Acustica, Vol. 49, Iss. 3, 1981-11 ,pp. : 205-211

S. Hirzel Verlag

Access to resources Recommend Favorite