RAMAN SPECTROSCOPY CHARACTERIZATION OF POLYCRYSTALLINE GaP THIN FILMS GROWN BY MO-CVD PROCESS USING [Et2Ga - PEt2]3 AS ONLY SOURCE

Publisher: Edp Sciences

E-ISSN: 0449-1947|43|C1|C1-347-C1-352

ISSN: 0449-1947

Source: Le Journal de Physique Colloques, Vol.43, Iss.C1, 1982-10, pp. : C1-347-C1-352

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