RESOLUTION OF FIELD-ION MICROSCOPY VERSUS SCANNING TUNNELLING MICROSCOPY FOR OBTAINING SURFACE CHARGE DENSITY CORRUGATIONS

Publisher： Edp Sciences

E-ISSN： 0449-1947|45|C9|C9-119-C9-124

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.45, Iss.C9, 1984-12, pp. : C9-119-C9-124

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