INTERNAL MEASUREMENTS FOR FAILURE ANALYSIS AND CHIP VERIFICATION OF VLSI CIRCUITS

Publisher： Edp Sciences

E-ISSN： 0449-1947|50|C6|C6-173-C6-173

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.50, Iss.C6, 1989-06, pp. : C6-173-C6-173

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