STRAIN-INDUCED BOUNDARY MIGRATION (SIBM) IN ALUMINUM BICRYSTALS EACH WITH A <211> TILT BOUNDARY

Publisher: Edp Sciences

E-ISSN: 0449-1947|49|C5|C5-605-C5-610

ISSN: 0449-1947

Source: Le Journal de Physique Colloques, Vol.49, Iss.C5, 1988-10, pp. : C5-605-C5-610

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