REFLECTIVITY MEASUREMENTS OF SYNTHETIC MULTILAYERS IN THE 1-5 nm WAVELENGTH RANGE

E-ISSN： 0449-1947|48|C9|C9-117-C9-121

ISSN： 0449-1947

Source： Le Journal de Physique Colloques, Vol.48, Iss.C9, 1987-12, pp. : C9-117-C9-121

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Liquid Carbon Reflectivity at 19 nm

By Mincigrucci Riccardo Giangrisostomi Erika Principi Emiliano Battistoni Andrea Bencivenga Filippo Cucini Riccardo Gessini Alessandro Izzo Maria Grazia Masciovecchio Claudio

Photonics, Vol. 2, Iss. 1, 2015-01 ,pp. : 50-56

MDPI

Access to resources Recommend Favorite

Luminescence of the semimagnetic semiconductor CdMnTe in the wavelength range 370–400 nm at high excitation levels

By Aksyanov I. Kompan M. Mesh M.

Physics of the Solid State, Vol. 49, Iss. 4, 2007-04 ,pp. : 691-695

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Free-standing optical filters for a nanolithography source operating in the 12–15 nm wavelength range

By Belik V. Zadiranov Yu. Il’inskaya N. Korlyakov A. Luchinin V. Markosov M. Seisyan R. Sher É.

Technical Physics Letters, Vol. 33, Iss. 6, 2007-06 ,pp. : 508-511

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Radiance Temperatures (in the Wavelength Range 530 to 1500 nm) of Nickel at Its Melting Point by a Pulse-Heating Technique

By Kaschnitz E. McClure J. Cezairliyan A.

International Journal of Thermophysics, Vol. 19, Iss. 6, 1998-11 ,pp. : 1637-1646

Springer Publishing Company

Access to resources Recommend Favorite