Publisher： Edp Sciences
E-ISSN： 0449-1947|49|C5|C5-665-C5-670
ISSN： 0449-1947
Source： Le Journal de Physique Colloques, Vol.49, Iss.C5, 1988-10, pp. : C5-665-C5-670
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
EBIC MEASUREMENTS OF A TRIPLE JUNCTION IN POLYCRYSTALLINE SILICON
Le Journal de Physique Colloques, Vol. 51, Iss. C1, 1990-01 ,pp. :
Access to resources
Recommend
CHARACTERIZATION OF POLYCRYSTALLINE SILICON BY EBIC
Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. :
EBIC MEASUREMENTS OF ANNEALED SILICON BICRYSTALS
Le Journal de Physique Colloques, Vol. 50, Iss. C6, 1989-06 ,pp. :
EBIC and conductance measurements in poly- and bicrystalline silicon
Revue de Physique Appliquée (Paris), Vol. 22, Iss. 7, 1987-07 ,pp. :