Simultaneous X‐ray fluorescence and scanning X‐ray diffraction microscopy at the Australian Synchrotron XFM beamline

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5775|23|5|1151-1157

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.23, Iss.5, 2016-09, pp. : 1151-1157

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