Band alignment and defect states in amorphous GaInZnO thin films grown on SiO₂/Si substrates

E-ISSN： 1096-9918|48|10|1062-1065

ISSN： 0142-2421

Source： SURFACE AND INTERFACE ANALYSIS, Vol.48, Iss.10, 2016-10, pp. : 1062-1065

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