Author： Djaziri S.
Publisher： Edp Sciences
E-ISSN： 2100-014x|6|issue|26003-26003
ISSN： 2100-014x
Source： EPJ Web of Conference, Vol.6, Iss.issue, 2010-06, pp. : 26003-26003
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Abstract
The mechanical behaviour of multilayered W/Cu thin films on polyimide substrate has been investigated at different scales and using complementary X-ray techniques and compared to finite element analysis. Mechanical testing has been carried out using a new biaxial tensile machine which allows for testing in controlled biaxial loading condition. This device has been developed for synchrotron measurements at DiffAbs beamline of the French synchrotron radiation facility (SOLEIL, Saint Aubin).
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