Modeling of the signal induced by the charged particles in silicon detector

E-ISSN： 2100-014x|66|issue|03049-03049

ISSN： 2100-014x

Source： EPJ Web of Conference, Vol.66, Iss.issue, 2014-03, pp. : 03049-03049

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Thorium-232 fission induced by light charged particles up to 70 MeV

EPJ Web of Conference, Vol. 146, Iss. issue, 2017-09 ,pp. : 04058-04058

Edp Sciences

Access to resources Recommend Favorite

Evolution of He-induced cavities and related defects in silicon studied by direct scattering of channeled particles

By Grob A. Grob J. J. Roqueta F.

EPJ Applied Physics (The), Vol. 23, Iss. 1, 2002-11 ,pp. : 19-23

Edp Sciences

Access to resources Recommend Favorite

Signal modeling and analysis

By Hammond J.K.

INTER-NOISE and NOISE-CON Congress and Conference Proceedings, Vol. 1988, Iss. 5, 1988-08 ,pp. : 33-38

Institute of Noise Control Engineering

Access to resources Recommend Favorite

Optimal signal selection for a highly segmented detector

By Peralva Bernardo S-M. Cerqueira Augusto S. Filho Luciano M.A. Seixas Jose M.

INTER-NOISE and NOISE-CON Congress and Conference Proceedings, Vol. 2010, Iss. 6, 2010-06 ,pp. : 4950-4959

Institute of Noise Control Engineering

Access to resources Recommend Favorite

Search for stable mutli-charged particles with the ATLAS experiment

EPJ Web of Conference, Vol. 60, Iss. issue, 2013-11 ,pp. : 20016-20016

Edp Sciences

Access to resources Recommend Favorite