High-resolution X-ray diffractometry and X-ray reflectometry techniques for structural studies of complicated thin-layered heterostructures: Complementarity between Fourier Transform-based procedures and simulation softwares

Publisher： Edp Sciences

E-ISSN： 1764-7177|118|1|203-211

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.118, Iss.1, 2004-11, pp. : 203-211

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

High resolution x-ray diffractometry of the structural characteristics of a semiconducting (InGa)As/GaAs superlattice

By Nesterets Ya.   Punegov V.   Pavlov K.   Faleev N.  

Technical Physics, Vol. 44, Iss. 2, 1999-02 ,pp. : 171-179

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Simulation of the stepped surface of a high-resolution X-ray diffractor

By Mazuritsky M.   Latush E.   Soldatov A.   Ugol’nitskii G.   Lyashenko V.   Marcelli A.  

Technical Physics Letters, Vol. 26, Iss. 6, 2000-06 ,pp. : 502-504

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

High-resolution radio observations of X-ray binaries

By  

Journal of Physics: Conference Series , Vol. 131, Iss. 1, 2008-10 ,pp. : 452-461

IOP Publishing

Access to resources Recommend Favorite

High-resolution X-ray spectroscopy of $\theta$ Carinae

By  

Astronomy & Astrophysics, Vol. 490, Iss. 2, 2008-11 ,pp. : 801-806

Edp Sciences

Access to resources Recommend Favorite