Publisher: Edp Sciences
E-ISSN: 1764-7177|125|issue|519-522
ISSN: 1155-4339
Source: Le Journal de Physique IV, Vol.125, Iss.issue, 2005-06, pp. : 519-522
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Thermal surface wave technique for thin film thermal diffusivity measurement
Le Journal de Physique IV, Vol. 04, Iss. C7, 1994-07 ,pp. :
By Tien Chuen-Lin Jaing Cheng-Chung Lee Cheng-Chung Chuang Kie-Pin
Journal of Modern Optics, Vol. 47, Iss. 10, 2000-08 ,pp. :
THERMAL WAVE PROBING OF THE OPTICAL, ELECTRONIC AND THERMAL PROPERTIES OF SEMICONDUCTORS
Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. :