Analysis and Evaluation of Interface Mechanics for Thin Films using the Method of Image

E-ISSN： 2261-236x|54|issue|01001-01001

ISSN： 2261-236x

Source： MATEC Web of conference, Vol.54, Iss.issue, 2016-04, pp. : 01001-01001

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Toxicogenomic evaluation of chemically induced chromosomal imbalance using DNA image analysis

By Hatzi Vasiliki I.

Toxicology Mechanisms and Methods, Vol. 23, Iss. 5, 2013-06 ,pp. : 303-307

Informa Healthcare

Access to resources Recommend Favorite

Analysis of Fiber deposition using Automatic Image Processing Method

EPJ Web of Conference, Vol. 45, Iss. issue, 2013-04 ,pp. : 01011-01011

Edp Sciences

Access to resources Recommend Favorite

An experimental method for measuring the Poisson's ratioin thin films and multilayers using a tensile machine set upon an X-ray goniometer

By Renault P. O. Badawi K. F. Goudeau Ph. Bimbault L.

EPJ Applied Physics (The), Vol. 10, Iss. 2, 2010-03 ,pp. : 91-96

Edp Sciences

Access to resources Recommend Favorite

Preparation of CuAlO₂ Thin Films by Sol-Gel Method Using Nitrate Solution Dip-Coating

MATEC Web of conference, Vol. 67, Iss. issue, 2016-07 ,pp. : 04012-04012

Edp Sciences

Access to resources Recommend Favorite

Anelastic Mechanical Behavior Measurement of thin Films Using Novel Beam deflection Method

By Tong C.-J.

EPJ Web of Conference, Vol. 6, Iss. issue, 2010-06 ,pp. : 40007-40007

Edp Sciences

Access to resources Recommend Favorite