Author： Eichstädt Sascha Link Alfred Elster Clemens
Publisher： MDPI
E-ISSN： 1424-8220|10|8|7621-7631
ISSN： 1424-8220
Source： Sensors, Vol.10, Iss.8, 2010-08, pp. : 7621-7631
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Abstract
The compensation of LTI systems and the evaluation of the according uncertainty is of growing interest in metrology. Uncertainty evaluation in metrology ought to follow specific guidelines, and recently two corresponding uncertainty evaluation schemes have been proposed for FIR and IIR filtering. We employ these schemes to compare an FIR and an IIR approach for compensating a second-order LTI system which has relevance in metrology. Our results suggest that the FIR approach is superior in the sense that it yields significantly smaller uncertainties when real-time evaluation of uncertainties is desired.
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