A Brief Review of Heavy-Ion Radiation Degradation and Failure of Silicon UMOS Power Transistors

Author: Galloway Kenneth F.  

Publisher: MDPI

E-ISSN: 2079-9292|3|4|582-593

ISSN: 2079-9292

Source: Electronics, Vol.3, Iss.4, 2014-09, pp. : 582-593

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Abstract