A One-Versus-All Class Binarization Strategy for Bearing Diagnostics of Concurrent Defects

Author： Ng Selina S. Y.   Tse Peter W.   Tsui Kwok L.  

Publisher： MDPI

E-ISSN： 1424-8220|14|1|1295-1321

ISSN： 1424-8220

Source： Sensors, Vol.14, Iss.1, 2014-01, pp. : 1295-1321

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