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Sensors, Vol. 16, Iss. 10, 2016-10 ,pp. : 1727-1727

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Inverse Problem in Nondestructive Testing Using Arrayed Eddy Current Sensors

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Digital Platform for Wafer-Level MEMS Testing and Characterization Using Electrical Response

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Sensors, Vol. 16, Iss. 9, 2016-09 ,pp. : 1553-1553

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Evaluation of an Extended Autocorrelation Phase Estimator for Ultrasonic Velocity Profiles Using Nondestructive Testing Systems

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Sensors, Vol. 16, Iss. 8, 2016-08 ,pp. : 1250-1250

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Fault Localization Method by Partitioning Memory Using Memory Map and the Stack for Automotive ECU Software Testing

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Applied Sciences, Vol. 6, Iss. 9, 2016-09 ,pp. : 266-266

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