Analysis of Deep Level Defects in GaN p-i-n Diodes after Beta Particle Irradiation

Author： Belahsene Sofiane Al Saqri Noor alhuda Jameel Dler Mesli Abdelmadjid Martinez Anthony de Sanoit Jacques Ougazzaden Abdallah Salvestrini Jean Paul Ramdane Abderrahim Henini Mohamed

Publisher： MDPI

E-ISSN： 2079-9292|4|4|1090-1100

ISSN： 2079-9292

Source： Electronics, Vol.4, Iss.4, 2015-12, pp. : 1090-1100

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