Opto-Acoustic Method for the Characterization of Thin-Film Adhesion

Author： Yoshida Sanichiro Didie David R. Didie Daniel Sasaki Tomohiro Park Hae-Sung Park Ik-Keun Gurney David

Publisher： MDPI

E-ISSN： 2076-3417|6|6|163-163

ISSN： 2076-3417

Source： Applied Sciences, Vol.6, Iss.6, 2016-05, pp. : 163-163

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Abstract

The elastic property of the film-substrate interface of thin-film systems is characterized with an opto-acoustic method. The thin-film specimens are oscillated with an acoustic transducer at audible frequencies, and the resultant harmonic response of the film surface is analyzed with optical interferometry. Polystyrene, Ti, Ti-Au and Ti-Pt films coated on the same silicon substrate are tested. For each film material, a pair of specimens is prepared; one is coated on a silicon substrate after the surface is treated with plasma bombardment, and the other is coated on an identical silicon substrate without a treatment. Experiments indicate that both the surface-treated and untreated specimens of all film materials have resonance in the audible frequency range tested. The elastic constant of the interface corresponding to the observed resonance is found to be orders of magnitude lower than that of the film or substrate material. Observations of these resonance-like behaviors and the associated stiffness of the interface are discussed.