A Low-Power and In Situ Annealing Technique for the Recovery of Active Devices After Proton Irradiation

E-ISSN： 2100-014x|170|issue|01006-01006

ISSN： 2100-014x

Source： EPJ Web of Conference, Vol.170, Iss.issue, 2018-01, pp. : 01006-01006

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