Evaluation and Reliability Assessment of GaN-on-Si MIS-HEMT for Power Switching Applications

Author： Chou Po-Chien   Chen Szu-Hao   Hsieh Ting-En   Cheng Stone   del Alamo Jesús A.   Chang Edward Yi  

Publisher： MDPI

E-ISSN： 1996-1073|10|2|233-233

ISSN： 1996-1073

Source： Energies, Vol.10, Iss.2, 2017-02, pp. : 233-233

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