Author: Papadakis I. Kessel R. Nevel L. Norgaard J. Aregbe Y. Smet M. Smeyers P. Taylor Philip
Publisher: Springer Publishing Company
ISSN: 0949-1775
Source: Accreditation and Quality Assurance, Vol.9, Iss.11-12, 2004-10, pp. : 704-710
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