Extreme ultraviolet spectrometer based on a transmission electron microscopy grid

Publisher： IOP Publishing

ISSN： 2040-8986

Source： Journal of Optics, Vol.17, Iss.1, 2015-01, pp. : 15502-15505

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

An energy stabilized post-column electron energy-loss spectrometer for transmission electron microscopy

By  

Journal of Physics: Conference Series , Vol. 126, Iss. 1, 2008-08 ,pp. : 378-381

IOP Publishing

Access to resources Recommend Favorite

Scanning transmission electron microscopy

By  

Le Journal de Physique IV, Vol. 03, Iss. C7, 1993-11 ,pp. : C7-2073-C7-2080

Edp Sciences

Access to resources Recommend Favorite

Holography and transmission electron microscopy

By  

Le Journal de Physique IV, Vol. 03, Iss. C7, 1993-11 ,pp. : C7-2063-C7-2072

Edp Sciences

Access to resources Recommend Favorite

ELECTRON TRANSMISSION MICROSCOPY

By  

Le Journal de Physique Colloques, Vol. 35, Iss. C7, 1974-12 ,pp. : C7-129-C7-139

Edp Sciences

Access to resources Recommend Favorite

Acceleration complex for extreme ultraviolet nanolithography based on a free-electron laser with kilowatt-scale average radiation power

By Syresin E.   Anchutkin V.   Budagov Yu.   Bel'skii A.   Gushchin O.   Lenskii I.   Ol'shevskii A.   Sisakyan A.   Trubnikov G.   Shelepin N.   Shirkov G.   Yurkov M.  

Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol. 5, Iss. 3, 2011-06 ,pp. : 520-525

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite