Synergistic effects of total ionizing dose on single event upset sensitivity in static random access memory under proton irradiation

Publisher： IOP Publishing

E-ISSN： 1741-4199|23|11|118503-118506

ISSN： 1674-1056

Source： Chinese Physics B, Vol.23, Iss.11, 2014-11, pp. : 118503-118506

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