Simulation of temperature and electric field-dependent barrier traps effects in AlGaN/GaN HEMTs

Publisher: IOP Publishing

E-ISSN: 1361-6641|30|1|15010-15017

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.30, Iss.1, 2015-01, pp. : 15010-15017

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