Self-heating and traps effects on the drain transient response of AlGaN/GaN HEMTs

Author: Yamin Zhang   Shiwei Feng   Hui Zhu   Xueqin Gong   Bing Deng   Lin Ma  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.35, Iss.10, 2014-10, pp. : 104003-104006

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