Microwave and power characteristics of AlGaN/GaN/Si high-electron mobility transistors with HfO2 and TiO2 passivation

Publisher: IOP Publishing

E-ISSN: 1361-6641|30|1|15016-15019

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.30, Iss.1, 2015-01, pp. : 15016-15019

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