Analog performance of standard and uniaxial strained triple-gate SOI FinFETs under x-ray radiation

Publisher： IOP Publishing

E-ISSN： 1361-6641|29|12|125015-125020

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.29, Iss.12, 2014-12, pp. : 125015-125020

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