Effect of surface Si redistribution on the alignment of Ge dots grown on pit-patterned Si(001) substrates

Publisher: IOP Publishing

E-ISSN: 1361-6528|25|47|475301-475306

ISSN: 0957-4484

Source: Nanotechnology, Vol.25, Iss.47, 2014-11, pp. : 475301-475306

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