Author： Rastello M L Degiovanni I P Sinclair A G Kück S Chunnilall C J Porrovecchio G Smid M Manoocheri F Ikonen E Kubarsepp T Stucki D Hong K S Kim S K Tosi A Brida G Meda A Piacentini F Traina P Natsheh A Al Cheung J Y Müller I Klein R Vaigu A
Publisher： IOP Publishing
E-ISSN： 1681-7575|51|6|S267-S275
ISSN： 0026-1394
Source： Metrologia, Vol.51, Iss.6, 2014-12, pp. : S267-S275
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A NEW SURVEY TARGET FOR INDUSTRIAL METROLOGY
By Green P. F.
Survey Review, Vol. 23, Iss. 181, 1976-07 ,pp. :
Access to resources
Recommend
Survey Review, Vol. 19, Iss. 148, 1968-04 ,pp. :
Application of general relativity to metrology
By Guinot B.
Metrologia, Vol. 34, Iss. 3, 1997-09 ,pp. :