Traceable metrology for characterizing quantum optical communication devices

Author: Chunnilall C J   Lepert G   Allerton J J   Hart C J   Sinclair A G  

Publisher: IOP Publishing

E-ISSN: 1681-7575|51|6|S258-S266

ISSN: 0026-1394

Source: Metrologia, Vol.51, Iss.6, 2014-12, pp. : S258-S266

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Abstract