Exploring Two‐Dimensional Transport Phenomena in Metal Oxide Heterointerfaces for Next‐Generation, High‐Performance, Thin‐Film Transistor Technologies

Publisher： John Wiley & Sons Inc

E-ISSN： 1613-6829|11|41|5472-5482

ISSN： 1613-6810

Source： SMALL, Vol.11, Iss.41, 2015-11, pp. : 5472-5482

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