Structural coupling across the direct EuO/Si interface

Author： Averyanov Dmitry V   Tokmachev Andrey M   Likhachev Igor A   Lobanovich Eduard F   Parfenov Oleg E   Pashaev Elkhan M   Sadofyev Yuri G   Subbotin Ilia A   Yakunin Sergey N   Storchak Vyacheslav G  

Publisher： IOP Publishing

E-ISSN： 1361-6528|27|4|45703-45709

ISSN： 0957-4484

Source： Nanotechnology, Vol.27, Iss.4, 2016-01, pp. : 45703-45709

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