Corrigendum: Scanning force microscopy of protein patterns (1994 Nanotechnology

Author： Frediani C   Allegrini M   Ascoli C   Connolly P   Labardi M   Moores G   Arnaud E Perez  

Publisher： IOP Publishing

E-ISSN： 1361-6528|27|6|69501-69501

ISSN： 0957-4484

Source： Nanotechnology, Vol.27, Iss.6, 2016-02, pp. : 69501-69501

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Corrigendum: Calibrated complex impedance and permittivity measurements with scanning microwave microscopy (2014 Nanotechnology 25 145703)

By Gramse G   Kasper M   Fumagalli L   Gomila G   Hinterdorfer P   Kienberger F  

Nanotechnology, Vol. 26, Iss. 14, 2015-04 ,pp. : 149501-149501

IOP Publishing

Access to resources Recommend Favorite

Corrigendum: Variable temperature electrochemical strain microscopy of Sm-doped ceria (2013 Nanotechnology 24 145401)

By Kumar A   Jesse S   Morozovska A   Eliseev E   Tebano A   Yang N   Kalinin S V  

Nanotechnology, Vol. 25, Iss. 8, 2014-02 ,pp. : 89501-89501

IOP Publishing

Access to resources Recommend Favorite

Scanning Electron Microscopy and Atomic Force Microscopy of Fibrous Gelatin Observed between AgBr Microcrystals

By Saijo Hiroshi   Kobayashi Yutaka   Shiojiri Makoto  

Journal of Imaging Science and Technology, Vol. 41, Iss. 5, 1997-09 ,pp. : 531-535

Society for Imaging Science and Technology

Access to resources Recommend Favorite

IN SITU INVESTIGATION OF RETENTION PROPERTIES OF POLYDOMAIN FERROELECTRIC THIN FILMS BY MULTIMODE SCANNING FORCE MICROSCOPY

By Wang Longhai   Yu Jun   Wang Zhihong   Zeng Huizhong   Wang Yunbo   Gao Junxiong  

Integrated Ferroelectrics, Vol. 98, Iss. 1, 2008-01 ,pp. : 26-34

Taylor & Francis Ltd

Access to resources Recommend Favorite