A comprehensive study of charge trapping in organic field-effect devices with promising semiconductors and different contact metals by displacement current measurements

Author： Bisoyi Sibani   Rödel Reinhold   Zschieschang Ute   Takimiya Kazuo   Klauk Hagen   Bisoyi Sibani   Bisoyi Sibani  

Publisher： IOP Publishing

E-ISSN： 1361-6641|31|2|25011-25020

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.31, Iss.2, 2016-02, pp. : 25011-25020

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