Investigating the complex mechanism of B migration in a magnetic-tunnel-junction trilayer structure—a combined study using XPS and TOF-SIMS

Author： Ying Ji-Feng   Ji Rong   Tran Michael N   Ernult Franck   Ying Ji-Feng   Ying Ji-Feng  

Publisher： IOP Publishing

E-ISSN： 1361-6463|49|6|65004-65011

ISSN： 0022-3727

Source： Journal of Physics D: Applied Physics, Vol.49, Iss.6, 2016-02, pp. : 65004-65011

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