Effects of Annealing Process on the Structural, Optical and Electrical Properties of Copper Oxide Thin Films Grown by Immersion Technique

Publisher: Trans Tech Publications

E-ISSN: 1662-8985|2016|1133|439-443

ISSN: 1022-6680

Source: Advanced Materials Research, Vol.2016, Iss.1133, 2016-02, pp. : 439-443

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