In-situ surface technique analyses and ex-situ characterization of Si1-xGex epilayers grown on Si(001)-2 ×1 by molecular beam epitaxy

Publisher： Edp Sciences

E-ISSN： 1286-4897|4|4|733-740

ISSN： 1155-4320

Source： Journal de Physique III, Vol.4, Iss.4, 1994-04, pp. : 733-740

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