Characterization of Ga1-xInxSb thin layers grown on GaAs substrate by infrared reflectivity

Publisher： Edp Sciences

E-ISSN： 1286-4897|3|9|1819-1824

ISSN： 1155-4320

Source： Journal de Physique III, Vol.3, Iss.9, 1993-09, pp. : 1819-1824

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