Optimization of deep-submicrometer temperature scalable MOSFET's based on two-dimensional numerical simulation

Publisher： Edp Sciences

E-ISSN： 1764-7177|08|PR3|Pr3-29-Pr3-32

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.08, Iss.PR3, 1998-06, pp. : Pr3-29-Pr3-32

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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