Model of hot-carrier induced degradation in ultra-deep sub-micrometer nMOSFET

Author： Xiao-Yi Lei Hong-Xia Liu Yue Zhang Xiao-Hua Ma Yue Hao

ISSN： 1674-1056

Source： Chinese Physics B, Vol.23, Iss.5, 2014-05, pp. : 57305-57309

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