Publisher: Edp Sciences
E-ISSN: 1764-7177|03|C7|C7-2057-C7-2062
ISSN: 1155-4339
Source: Le Journal de Physique IV, Vol.03, Iss.C7, 1993-11, pp. : C7-2057-C7-2062
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
A transmission electron microscopy study of porous silicon
Journal of Physics: Conference Series , Vol. 26, Iss. 1, 2006-02 ,pp. :
Scanning transmission electron microscopy
Le Journal de Physique IV, Vol. 03, Iss. C7, 1993-11 ,pp. :
Holography and transmission electron microscopy
Le Journal de Physique IV, Vol. 03, Iss. C7, 1993-11 ,pp. :