Mechanisms of damage formation in Eu-implanted GaN probed by X-ray diffraction

Author： Lacroix B.   Leclerc S.   Declémy A.   Lorenz K.   Alves E.   Ruterana P.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|96|4|46002-46002

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.96, Iss.4, 2011-11, pp. : 46002-46002

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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